Nanophotonic structures can confine and shape optical fields on length scales far below the wavelength of light, enabling new ways to control electrons with light. In our recent collaborative publication in ACS Photonics, we use ultrafast 4D scanning transmission electron microscopy (U4DSTEM) to visualize the transverse component of optical near-fields in a resonant silicon photonic structure with nanometer resolution. The measurements reveal how these optical fields deflect electrons at optical frequencies and provide new insights for the development of next-generation photonic electron accelerators and ultrafast electron control.
Imaging the Transverse Component of Optical Near-Fields – new publication in ACS Photonics
